DIII-D RESEARCH OPPORTUNITIES FORUM FOR THE 2008 EXPERIMENTAL CAMPAIGN Login | Review | Submit | Logout | Help

Questions about this website? Contact Andrew LeBlanc
Questions about ROF? Contact Chuck Greenfield


Print this page
Title 393: NSTX/DIII-D simularity experiments
Name:Eric Fredrickson () Affiliation:Princeton Plasma Physics Laboratory
Research Area:Energetic Particles Presentation time: Not requested
Co-Author(s): (hopefully Heidbrink, Van Zeeland, Gorelenkov, other interested parties
Description: Revisit NSTX simularity discharges previously developed to compare Alfven Cascade beta scaling, TAE avalanche thresholds and polarization measurements of CAE.
Experimental Approach/Plan: Reproduce condition developed previously for TAE aspect ratio scaling experiment (e.g., 120190 etc). Lower density to reduce beta below stabilization threshold for Alfven Cascades (rsAE) as was done in NSTX experiments. Find condition where TAE present and do power scan to find threshold for TAE excitation. Attempt to reach threshold for TAE avalanching. CAE will likely be present in these shots and use new Mirnov coils to measure polarization of CAE, other modes.
Background: Alfven Cascades seen in high field DIII-D plasmas and are suspected of fast ion redistribution. Operation at low field, and similar parameters to NSTX should put beta above threshold for "stabilization". First goal is to search for this beta-scaling of AC frequency sweeps. Second goal is to look for beta-fast threshold for onset of TAE, and then attempt to push beta-fast up to threshold for avalanch onset. Threshold might be higher in higher aspect ratio device. Finally, interesting results have been found regarding the polarization of TAE, AC and CAE on NSTX. Data from DIII-D could contribute to understanding the observed polarizations.
Resource Requirements: Machine operation at 0.5 to 0.6 T and neutral beams at 80 kV. Possibly cryo-pumps to allow low density operation. Possibly need TF scan.
Diagnostic Requirements: Fast Mirnov acquisition (5-10 MHz), reflectometers, BES, other fast internal mode diagnostics. MSE, CER, TS, neutrons and certainly FIDA.
Analysis Requirements: EFIT and TRANSP. Higher level analysis by NOVA-k and/or M3D.
Other Requirements: --